Microfocus X-ray fluorescence spectrometer МS50
TECHNICAL AND METROLOGICAL DETAILS
| Sample sizes | from 5 µm3 and higher |
| Analyzed elements | from Na to U (air) |
| Detection limit (depending on the elements), % | 0,0001 ÷ 100 (solid) ≤ 10-7 ÷ 100 (liquid) |
| Absolute local sensitivity, g | 10-15 ÷ 10-13 |
| Types of samples | solid, powders, liquid, films |
| Measurement environment | air, helium |
| Detector | SDD |
| Cooling | Peltier elements |
| Energy Resolution @ 5.9 keV | 125 ÷ 135 eV |
| X-ray probe position on the sample | optical, laser |
| X-ray tube combined with power source (monoblock) | Yes |
| Target Material | Мo |
| Option | Rh, Ag, Pd, Au, Ta, W |
| X-ray optics | polycapillary lens |
| Tube voltage | 10 ÷ 40 (50) kV |
| Tube current | 5 ÷ 200 µA |
| Cooling | air |
| PC Interface | USB |
| Spectrometer Control | software with automatic shutdown |
| Input supply | 220 V AC / 50-60 Hz, battery option |
| Weight | 7 kg |
| Dimensions (DxWxH), mm | 200х200х400 |